%0 Conference Paper %1 conf/aspdac/HosokawaYO01 %A Hosokawa, Toshinori %A Yoshimura, Masayoshi %A Ohta, Mitsuyasu %B ASP-DAC %D 2001 %E Goto, Satoshi %I ACM %K dblp %P 485-491 %T Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2001.html#HosokawaYO01 %@ 0-7803-6634-4

@inproceedings{conf/aspdac/HosokawaYO01, added-at = {2018-11-06T00:00:00.000+0100}, author = {Hosokawa, Toshinori and Yoshimura, Masayoshi and Ohta, Mitsuyasu}, biburl = {https://www.bibsonomy.org/bibtex/296abfdde248de67747ab4243f09fbe54/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2001}, editor = {Goto, Satoshi}, ee = {https://doi.org/10.1145/370155.370517}, interhash = {8de18d87b3495d3147c13ab8a44f3cf3}, intrahash = {96abfdde248de67747ab4243f09fbe54}, isbn = {0-7803-6634-4}, keywords = {dblp}, pages = {485-491}, publisher = {ACM}, timestamp = {2019-10-17T16:43:55.000+0200}, title = {Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2001.html#HosokawaYO01}, year = 2001 }