%0 Conference Paper %1 conf/ieeesensors/GandhiJRKDKGB23 %A Gandhi, Navneet %A Jaisawal, Rajeewa Kumar %A Rathore, Sunil %A Kondekar, P. N. %A Dixit, Ankit %A Kumar, Navneen %A Georgiev, Vihar %A Bagga, Navjeet %B SENSORS %D 2023 %I IEEE %K dblp %P 1-4 %T Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. %U http://dblp.uni-trier.de/db/conf/ieeesensors/ieeesensors2023.html#GandhiJRKDKGB23 %@ 979-8-3503-0387-2

@inproceedings{conf/ieeesensors/GandhiJRKDKGB23, added-at = {2024-05-07T00:00:00.000+0200}, author = {Gandhi, Navneet and Jaisawal, Rajeewa Kumar and Rathore, Sunil and Kondekar, P. N. and Dixit, Ankit and Kumar, Navneen and Georgiev, Vihar and Bagga, Navjeet}, biburl = {https://www.bibsonomy.org/bibtex/28c80c7dbe15c0b78e00e001acfb1bd00/dblp}, booktitle = {SENSORS}, crossref = {conf/ieeesensors/2023}, ee = {https://doi.org/10.1109/SENSORS56945.2023.10324885}, interhash = {916aa1a94c0416102be51768b7be5b2b}, intrahash = {8c80c7dbe15c0b78e00e001acfb1bd00}, isbn = {979-8-3503-0387-2}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-05-13T10:11:39.000+0200}, title = {Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor.}, url = {http://dblp.uni-trier.de/db/conf/ieeesensors/ieeesensors2023.html#GandhiJRKDKGB23}, year = 2023 }