Meta data
- BibTeX key
- conf/metroxraine/LiBGYLSDDMCFSS23
- entry type
- inproceedings
- booktitle
- MetroXRAINE
- year
- 2023
- pages
- 412-416
- publisher
- IEEE
- crossref
- conf/metroxraine/2023
- ee
- https://doi.org/10.1109/MetroXRAINE58569.2023.10405715
- isbn
- 979-8-3503-0080-2
- url
- http://dblp.uni-trier.de/db/conf/metroxraine/metroxraine2023.html#LiBGYLSDDMCFSS23
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- please select -%0 Conference Paper
%1 conf/metroxraine/LiBGYLSDDMCFSS23
%A Li, Shuai
%A Bao, Xiue
%A Gugliandolo, Giovanni
%A Yuan, Haoyun
%A Li, Jinkai
%A Shao, Linxiang
%A Du, Minghe
%A Donato, Nicola
%A Marinkovic, Zlatica
%A Crupi, Giovanni
%A Fang, Lili
%A Si, Liming
%A Sun, Houjun
%B MetroXRAINE
%D 2023
%I IEEE
%K dblp
%P 412-416
%T Defect Modeling During the SLM Process for Manufacturing Microwave Devices.
%U http://dblp.uni-trier.de/db/conf/metroxraine/metroxraine2023.html#LiBGYLSDDMCFSS23
%@ 979-8-3503-0080-2
@inproceedings{conf/metroxraine/LiBGYLSDDMCFSS23,
added-at = {2024-02-16T00:00:00.000+0100},
author = {Li, Shuai and Bao, Xiue and Gugliandolo, Giovanni and Yuan, Haoyun and Li, Jinkai and Shao, Linxiang and Du, Minghe and Donato, Nicola and Marinkovic, Zlatica and Crupi, Giovanni and Fang, Lili and Si, Liming and Sun, Houjun},
biburl = {https://www.bibsonomy.org/bibtex/283135faccc6a4da98794dbaca589c452/dblp},
booktitle = {MetroXRAINE},
crossref = {conf/metroxraine/2023},
ee = {https://doi.org/10.1109/MetroXRAINE58569.2023.10405715},
interhash = {938b6253ebadc7e7d27f3254d24fbcba},
intrahash = {83135faccc6a4da98794dbaca589c452},
isbn = {979-8-3503-0080-2},
keywords = {dblp},
pages = {412-416},
publisher = {IEEE},
timestamp = {2024-04-10T00:58:38.000+0200},
title = {Defect Modeling During the SLM Process for Manufacturing Microwave Devices.},
url = {http://dblp.uni-trier.de/db/conf/metroxraine/metroxraine2023.html#LiBGYLSDDMCFSS23},
year = 2023
}