Inproceedings,
Robust Control for Linear Stages in Electronic Manufacturing.
R. Quintanilla, J. Wen, M. Arcak, J. Frankel, M. Peeples, and M. Unrath.ACC, page 1269-1274. IEEE, (2007)
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- BibTeX key
- conf/acc/QuintanillaWAFP07
- entry type
- inproceedings
- booktitle
- ACC
- year
- 2007
- pages
- 1269-1274
- publisher
- IEEE
- crossref
- conf/amcc/2007
- ee
- https://doi.org/10.1109/ACC.2007.4282545
- isbn
- 1-4244-0989-6
- url
- http://dblp.uni-trier.de/db/conf/amcc/acc2007.html#QuintanillaWAFP07
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- please select -%0 Conference Paper
%1 conf/acc/QuintanillaWAFP07
%A Quintanilla, Rafael
%A Wen, John T.
%A Arcak, Murat
%A Frankel, Joe
%A Peeples, Mark
%A Unrath, Mark
%B ACC
%D 2007
%I IEEE
%K dblp
%P 1269-1274
%T Robust Control for Linear Stages in Electronic Manufacturing.
%U http://dblp.uni-trier.de/db/conf/amcc/acc2007.html#QuintanillaWAFP07
%@ 1-4244-0989-6
@inproceedings{conf/acc/QuintanillaWAFP07,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Quintanilla, Rafael and Wen, John T. and Arcak, Murat and Frankel, Joe and Peeples, Mark and Unrath, Mark},
biburl = {https://www.bibsonomy.org/bibtex/2d1802d321c2140b16acd1525ea5ef9c9/dblp},
booktitle = {ACC},
crossref = {conf/amcc/2007},
ee = {https://doi.org/10.1109/ACC.2007.4282545},
interhash = {9392b33f3e18d54dbac5b9d51d2abbde},
intrahash = {d1802d321c2140b16acd1525ea5ef9c9},
isbn = {1-4244-0989-6},
keywords = {dblp},
pages = {1269-1274},
publisher = {IEEE},
timestamp = {2024-04-09T13:39:59.000+0200},
title = {Robust Control for Linear Stages in Electronic Manufacturing.},
url = {http://dblp.uni-trier.de/db/conf/amcc/acc2007.html#QuintanillaWAFP07},
year = 2007
}