%0 Journal Article %1 journals/mr/BoddaertBBGC10 %A Boddaert, Xavier %A Bensaid, B. %A Benaben, Patrick %A Gwoziecki, Romain %A Coppard, Romain %D 2010 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1884-1887 %T Mechanical and thermal reliability of printed organic thin-film transistor. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BoddaertBBGC10 %V 50

@article{journals/mr/BoddaertBBGC10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Boddaert, Xavier and Bensaid, B. and Benaben, Patrick and Gwoziecki, Romain and Coppard, Romain}, biburl = {https://www.bibsonomy.org/bibtex/21fc4bf1a47e276dad28d897eac1a74d4/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.018}, interhash = {94435a86accf3ecdf1c2b82c36d7f39a}, intrahash = {1fc4bf1a47e276dad28d897eac1a74d4}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1884-1887}, timestamp = {2020-02-25T13:22:20.000+0100}, title = {Mechanical and thermal reliability of printed organic thin-film transistor.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BoddaertBBGC10}, volume = 50, year = 2010 }