%0 Conference Paper %1 conf/irps/PieperCXDKBWFCEB24 %A Pieper, Nicholas J. %A Chun, M. %A Xiong, Yoni %A Dattilo, H. M. %A Kronenberg, Jenna B. %A Baeg, Sanghyeon %A Wen, Shi-Jie %A Fung, Rita %A Chan, D. %A Escobar, C. %A Bhuva, Bharat L. %B IRPS %D 2024 %I IEEE %K dblp %P 1-7 %T Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#PieperCXDKBWFCEB24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/PieperCXDKBWFCEB24, added-at = {2024-05-31T00:00:00.000+0200}, author = {Pieper, Nicholas J. and Chun, M. and Xiong, Yoni and Dattilo, H. M. and Kronenberg, Jenna B. and Baeg, Sanghyeon and Wen, Shi-Jie and Fung, Rita and Chan, D. and Escobar, C. and Bhuva, Bharat L.}, biburl = {https://www.bibsonomy.org/bibtex/283ba7093209a2d8278ea0b7ab07f7ad3/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529337}, interhash = {9501891e79aebb0f154f2dbf0a6f33dc}, intrahash = {83ba7093209a2d8278ea0b7ab07f7ad3}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-06-03T07:16:33.000+0200}, title = {Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#PieperCXDKBWFCEB24}, year = 2024 }