%0 Conference Paper %1 conf/irps/YuZFMHX20 %A Yu, Kuilong %A Zhu, Xiaojuan %A Fang, Rui %A Ma, Tingting %A Han, Kun %A Xia, Zhongyi %B IRPS %D 2020 %I IEEE %K dblp %P 1-4 %T Hybrid HCI Degradation in Sub-micron NMOSFET due to Mixed Back-end Process Damages. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YuZFMHX20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/YuZFMHX20, added-at = {2020-07-30T00:00:00.000+0200}, author = {Yu, Kuilong and Zhu, Xiaojuan and Fang, Rui and Ma, Tingting and Han, Kun and Xia, Zhongyi}, biburl = {https://www.bibsonomy.org/bibtex/23ccb48b474e61eb40496f11ac6978340/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129336}, interhash = {95914bc06a5f84b826bcd9b12ab0dfe1}, intrahash = {3ccb48b474e61eb40496f11ac6978340}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2020-07-31T11:52:08.000+0200}, title = {Hybrid HCI Degradation in Sub-micron NMOSFET due to Mixed Back-end Process Damages.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YuZFMHX20}, year = 2020 }