%0 Conference Paper %1 conf/itc/NakaharaHKKK99 %A Nakahara, Shigeru %A Higeta, Keiichi %A Kohno, Masaki %A Kawamura, Toshiaki %A Kakitani, Keizo %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 301-310 %T Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#NakaharaHKKK99 %@ 0-7803-5753-1

@inproceedings{conf/itc/NakaharaHKKK99, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nakahara, Shigeru and Higeta, Keiichi and Kohno, Masaki and Kawamura, Toshiaki and Kakitani, Keizo}, biburl = {https://www.bibsonomy.org/bibtex/2a37ee23694de5b6649083efe29d87a23/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805644}, interhash = {96ece466039e75914288b966c610fc02}, intrahash = {a37ee23694de5b6649083efe29d87a23}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {301-310}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#NakaharaHKKK99}, year = 1999 }