%0 Conference Paper %1 conf/ats/SikdarRD01 %A Sikdar, Biplab K. %A Roy, Samir %A Das, Debesh K. %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 285- %T Enhancing BIST Quality of Sequential Machines through Degree-of-Freedom Analysis. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#SikdarRD01 %@ 0-7695-1378-6

@inproceedings{conf/ats/SikdarRD01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sikdar, Biplab K. and Roy, Samir and Das, Debesh K.}, biburl = {https://www.bibsonomy.org/bibtex/28f3ac815ba92d74ae92ed54a7ceca439/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990297}, interhash = {975f62f54c851327a728a4fc879202e1}, intrahash = {8f3ac815ba92d74ae92ed54a7ceca439}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {285-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {Enhancing BIST Quality of Sequential Machines through Degree-of-Freedom Analysis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#SikdarRD01}, year = 2001 }