%0 Conference Paper %1 conf/itc/StaudtBRL20 %A von Staudt, Hans Martin %A Benhebibi, Mohamed Anas %A Rearick, Jeff %A Laisne, Michael %B ITC %D 2020 %I IEEE %K dblp %P 1-10 %T Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. %U http://dblp.uni-trier.de/db/conf/itc/itc2020.html#StaudtBRL20 %@ 978-1-7281-9113-3

@inproceedings{conf/itc/StaudtBRL20, added-at = {2021-01-25T00:00:00.000+0100}, author = {von Staudt, Hans Martin and Benhebibi, Mohamed Anas and Rearick, Jeff and Laisne, Michael}, biburl = {https://www.bibsonomy.org/bibtex/2a40a37595e109ca12ce07e8ee55d9223/dblp}, booktitle = {ITC}, crossref = {conf/itc/2020}, ee = {https://doi.org/10.1109/ITC44778.2020.9325267}, interhash = {99985ec45f188c5a3a56f822fda86ca8}, intrahash = {a40a37595e109ca12ce07e8ee55d9223}, isbn = {978-1-7281-9113-3}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE}, timestamp = {2024-04-10T00:23:05.000+0200}, title = {Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2020.html#StaudtBRL20}, year = 2020 }