@inproceedings{conf/vdat/GuptaBBBDBC22,
added-at = {2022-12-19T00:00:00.000+0100},
author = {Gupta, Aniket and Bajpai, Govind and Bagga, Navjeet and Banchhor, Shashank and Dasgupta, Sudeb and Bulusu, Anand and Chauhan, Nitanshu},
biburl = {https://www.bibsonomy.org/bibtex/23fc0d92b8803361e8ab3a7465914af95/dblp},
booktitle = {VDAT},
crossref = {conf/vdat/2022},
editor = {Shah, Ambika Prasad and Dasgupta, Sudeb and Darji, Anand D. and Tudu, Jaynarayan T.},
ee = {https://doi.org/10.1007/978-3-031-21514-8_8},
interhash = {9a10574163b1d453f17a616f779da782},
intrahash = {3fc0d92b8803361e8ab3a7465914af95},
isbn = {978-3-031-21514-8},
keywords = {dblp},
pages = {85-96},
publisher = {Springer},
series = {Communications in Computer and Information Science},
timestamp = {2024-04-10T01:49:33.000+0200},
title = {Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective.},
url = {http://dblp.uni-trier.de/db/conf/vdat/vdat2022.html#GuptaBBBDBC22},
volume = 1687,
year = 2022
}