%0 Journal Article %1 journals/aei/FanHJCJ20 %A Fan, Shu-Kai S. %A Hsu, Chia-Yu %A Jen, Chih-Hung %A Chen, Kuan-Lung %A Juan, Li-Ting %D 2020 %J Adv. Eng. Informatics %K dblp %P 101166 %T Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes. %U http://dblp.uni-trier.de/db/journals/aei/aei46.html#FanHJCJ20 %V 46

@article{journals/aei/FanHJCJ20, added-at = {2020-12-08T00:00:00.000+0100}, author = {Fan, Shu-Kai S. and Hsu, Chia-Yu and Jen, Chih-Hung and Chen, Kuan-Lung and Juan, Li-Ting}, biburl = {https://www.bibsonomy.org/bibtex/2e752548101c7de4819612440d2ea793d/dblp}, ee = {https://doi.org/10.1016/j.aei.2020.101166}, interhash = {9a3610d3a6f5c2189b7c50e689d62b75}, intrahash = {e752548101c7de4819612440d2ea793d}, journal = {Adv. Eng. Informatics}, keywords = {dblp}, pages = 101166, timestamp = {2024-04-09T00:36:19.000+0200}, title = {Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes.}, url = {http://dblp.uni-trier.de/db/journals/aei/aei46.html#FanHJCJ20}, volume = 46, year = 2020 }