%0 Conference Paper %1 conf/irps/DingLQZZ22 %A Ding, Yaru %A Liu, Wei %A Qu, Yiming %A Zhao, Liang %A Zhao, Yi %B IRPS %D 2022 %I IEEE %K dblp %P 50-1 %T Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#DingLQZZ22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/DingLQZZ22, added-at = {2022-10-02T00:00:00.000+0200}, author = {Ding, Yaru and Liu, Wei and Qu, Yiming and Zhao, Liang and Zhao, Yi}, biburl = {https://www.bibsonomy.org/bibtex/29cce19706eeafa6b7700419138da7f7f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764559}, interhash = {9d06b7d9b7c454d5d5ce1a9eb8bf77b8}, intrahash = {9cce19706eeafa6b7700419138da7f7f}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = {50-1}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#DingLQZZ22}, year = 2022 }