%0 Conference Paper %1 conf/iscas/CrupiAFMKGMWH11 %A Crupi, Felice %A Alioto, Massimo %A Franco, Jacopo %A Magnone, Paolo %A Kaczer, Ben %A Groeseneken, Guido %A Mitard, Jérôme %A Witters, Liesbeth %A Hoffmann, Thomas Y. %B ISCAS %D 2011 %I IEEE %K dblp %P 2249-2252 %T Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2011.html#CrupiAFMKGMWH11 %@ 978-1-4244-9472-9

@inproceedings{conf/iscas/CrupiAFMKGMWH11, added-at = {2019-10-19T00:00:00.000+0200}, author = {Crupi, Felice and Alioto, Massimo and Franco, Jacopo and Magnone, Paolo and Kaczer, Ben and Groeseneken, Guido and Mitard, Jérôme and Witters, Liesbeth and Hoffmann, Thomas Y.}, biburl = {https://www.bibsonomy.org/bibtex/2cc21858378bded34946e5b89102562b4/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2011}, ee = {https://doi.org/10.1109/ISCAS.2011.5938049}, interhash = {9e365b8319df20da2e6f8c6358fa8373}, intrahash = {cc21858378bded34946e5b89102562b4}, isbn = {978-1-4244-9472-9}, keywords = {dblp}, pages = {2249-2252}, publisher = {IEEE}, timestamp = {2019-10-22T14:52:33.000+0200}, title = {Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2011.html#CrupiAFMKGMWH11}, year = 2011 }