%0 Conference Paper %1 conf/ats/KuchiiHT96 %A Kuchii, Toshimasa %A Hashizume, Masaki %A Tamesada, Takeomi %B Asian Test Symposium %D 1996 %I IEEE Computer Society %K dblp %P 171-176 %T Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1996.html#KuchiiHT96 %@ 0-8186-7478-4

@inproceedings{conf/ats/KuchiiHT96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kuchii, Toshimasa and Hashizume, Masaki and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/268ebfad1f074618ea9ff5c86c5135e91/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1996.555155}, interhash = {a1551ce431a3e67ff4ece8399473827a}, intrahash = {68ebfad1f074618ea9ff5c86c5135e91}, isbn = {0-8186-7478-4}, keywords = {dblp}, pages = {171-176}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:50.000+0200}, title = {Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1996.html#KuchiiHT96}, year = 1996 }