%0 Conference Paper %1 conf/isqed/LiuTK08 %A Liu, Zhiyu %A Tawfik, Sherif A. %A Kursun, Volkan %B ISQED %D 2008 %I IEEE Computer Society %K dblp %P 305-310 %T Statistical Data Stability and Leakage Evaluation of FinFET SRAM Cells with Dynamic Threshold Voltage Tuning under Process Parameter Fluctuations. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2008.html#LiuTK08 %@ 978-0-7695-3117-5

@inproceedings{conf/isqed/LiuTK08, added-at = {2023-03-23T00:00:00.000+0100}, author = {Liu, Zhiyu and Tawfik, Sherif A. and Kursun, Volkan}, biburl = {https://www.bibsonomy.org/bibtex/20a072bd01370647ff367c703398d387a/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2008.97}, interhash = {a1cad0f5672dc8c47ac9519b3c9da742}, intrahash = {0a072bd01370647ff367c703398d387a}, isbn = {978-0-7695-3117-5}, keywords = {dblp}, pages = {305-310}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:09:44.000+0200}, title = {Statistical Data Stability and Leakage Evaluation of FinFET SRAM Cells with Dynamic Threshold Voltage Tuning under Process Parameter Fluctuations.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2008.html#LiuTK08}, year = 2008 }