Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/TyaginovSSGG09
%A Tyaginov, Stanislav
%A Sverdlov, Viktor
%A Starkov, Ivan A.
%A Gös, Wolfgang
%A Grasser, Tibor
%D 2009
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 998-1002
%T Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.
%U http://dblp.uni-trier.de/db/journals/mr/mr49.html#TyaginovSSGG09
%V 49
@article{journals/mr/TyaginovSSGG09,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Tyaginov, Stanislav and Sverdlov, Viktor and Starkov, Ivan A. and Gös, Wolfgang and Grasser, Tibor},
biburl = {https://www.bibsonomy.org/bibtex/22f9f17323b9ab13692ad54378ffd6068/dblp},
ee = {https://doi.org/10.1016/j.microrel.2009.06.018},
interhash = {a1f1ea187bfda3af0811d50ee0bb255f},
intrahash = {2f9f17323b9ab13692ad54378ffd6068},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {998-1002},
timestamp = {2020-02-25T13:27:32.000+0100},
title = {Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#TyaginovSSGG09},
volume = 49,
year = 2009
}