%0 Conference Paper %1 conf/ifip5-7/YuB22 %A Yu, Na Hyeon %A Baek, Sujeong %B APMS (1) %D 2022 %E Kim, Duck Young %E von Cieminski, Gregor %E Romero, David %I Springer %K dblp %P 11-18 %T Fault Detection in Automatic Manufacturing Processes via 2D Image Analysis Using a Combined CNN-LSTM Model. %U http://dblp.uni-trier.de/db/conf/ifip5-7/apms2022-1.html#YuB22 %V 663 %@ 978-3-031-16407-1

@inproceedings{conf/ifip5-7/YuB22, added-at = {2022-10-18T00:00:00.000+0200}, author = {Yu, Na Hyeon and Baek, Sujeong}, biburl = {https://www.bibsonomy.org/bibtex/2098f4baf476d0529af5c47f9c8ac8672/dblp}, booktitle = {APMS (1)}, crossref = {conf/ifip5-7/2022-1}, editor = {Kim, Duck Young and von Cieminski, Gregor and Romero, David}, ee = {https://doi.org/10.1007/978-3-031-16407-1_2}, interhash = {a2685b167c16fd560600fdb3e8a5b8db}, intrahash = {098f4baf476d0529af5c47f9c8ac8672}, isbn = {978-3-031-16407-1}, keywords = {dblp}, pages = {11-18}, publisher = {Springer}, series = {IFIP Advances in Information and Communication Technology}, timestamp = {2024-04-15T07:04:37.000+0200}, title = {Fault Detection in Automatic Manufacturing Processes via 2D Image Analysis Using a Combined CNN-LSTM Model.}, url = {http://dblp.uni-trier.de/db/conf/ifip5-7/apms2022-1.html#YuB22}, volume = 663, year = 2022 }