%0 Journal Article %1 journals/mr/VanziMMX16 %A Vanzi, Massimo %A Mura, Giovanna %A Marcello, Giulia %A Xiao, Kunhui %D 2016 %J Microelectron. Reliab. %K dblp %P 617-622 %T ESD tests on 850 nm GaAs-based VCSELs. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#VanziMMX16 %V 64

@article{journals/mr/VanziMMX16, added-at = {2023-03-21T00:00:00.000+0100}, author = {Vanzi, Massimo and Mura, Giovanna and Marcello, Giulia and Xiao, Kunhui}, biburl = {https://www.bibsonomy.org/bibtex/238d5bd819dad7f51e409c0e9ad0dee70/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.023}, interhash = {a35821c28e39fe0682c9cad0f2e71e73}, intrahash = {38d5bd819dad7f51e409c0e9ad0dee70}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {617-622}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {ESD tests on 850 nm GaAs-based VCSELs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#VanziMMX16}, volume = 64, year = 2016 }