%0 Conference Paper %1 conf/aiccc/GuanGL21 %A Guan, Lili %A Guan, Jinglong %A Li, Jiacheng %B AICCC %D 2021 %I ACM %K dblp %P 179-185 %T Time-to-Failure Prediction of Electronic Devices Based on Hawkes Point Process. %U http://dblp.uni-trier.de/db/conf/aiccc/aiccc2021.html#GuanGL21 %@ 978-1-4503-8416-2

@inproceedings{conf/aiccc/GuanGL21, added-at = {2022-03-22T00:00:00.000+0100}, author = {Guan, Lili and Guan, Jinglong and Li, Jiacheng}, biburl = {https://www.bibsonomy.org/bibtex/289733d1c649d1cbfbff9b7ae49dba152/dblp}, booktitle = {AICCC}, crossref = {conf/aiccc/2021}, ee = {https://doi.org/10.1145/3508259.3508285}, interhash = {a38bc91205d86c550378c7aa62095d1d}, intrahash = {89733d1c649d1cbfbff9b7ae49dba152}, isbn = {978-1-4503-8416-2}, keywords = {dblp}, pages = {179-185}, publisher = {ACM}, timestamp = {2024-04-09T18:43:11.000+0200}, title = {Time-to-Failure Prediction of Electronic Devices Based on Hawkes Point Process.}, url = {http://dblp.uni-trier.de/db/conf/aiccc/aiccc2021.html#GuanGL21}, year = 2021 }