%0 Conference Paper %1 conf/vlsi/LarssonE05 %A Larsson, Erik %A Edbom, Stina %B VLSI-SoC %D 2005 %E da Luz Reis, Ricardo Augusto %E Osseiran, Adam %E Pfleiderer, Hans-Jörg %I Springer %K dblp %P 221-244 %T Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. %U http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#LarssonE05 %V 240 %@ 978-0-387-73660-0

@inproceedings{conf/vlsi/LarssonE05, added-at = {2018-06-26T00:00:00.000+0200}, author = {Larsson, Erik and Edbom, Stina}, biburl = {https://www.bibsonomy.org/bibtex/20c5e4b7ab093abb043cef0d753475fe3/dblp}, booktitle = {VLSI-SoC}, crossref = {conf/vlsi/2005soc}, editor = {da Luz Reis, Ricardo Augusto and Osseiran, Adam and Pfleiderer, Hans-Jörg}, ee = {https://doi.org/10.1007/978-0-387-73661-7_15}, interhash = {a4de6a942f98129744ed24afaf258776}, intrahash = {0c5e4b7ab093abb043cef0d753475fe3}, isbn = {978-0-387-73660-0}, keywords = {dblp}, pages = {221-244}, publisher = {Springer}, series = {IFIP}, timestamp = {2018-06-27T13:12:42.000+0200}, title = {Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint.}, url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#LarssonE05}, volume = 240, year = 2005 }