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%0 Conference Paper
%1 conf/vlsi/LarssonE05
%A Larsson, Erik
%A Edbom, Stina
%B VLSI-SoC
%D 2005
%E da Luz Reis, Ricardo Augusto
%E Osseiran, Adam
%E Pfleiderer, Hans-Jörg
%I Springer
%K dblp
%P 221-244
%T Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint.
%U http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#LarssonE05
%V 240
%@ 978-0-387-73660-0
@inproceedings{conf/vlsi/LarssonE05,
added-at = {2018-06-26T00:00:00.000+0200},
author = {Larsson, Erik and Edbom, Stina},
biburl = {https://www.bibsonomy.org/bibtex/20c5e4b7ab093abb043cef0d753475fe3/dblp},
booktitle = {VLSI-SoC},
crossref = {conf/vlsi/2005soc},
editor = {da Luz Reis, Ricardo Augusto and Osseiran, Adam and Pfleiderer, Hans-Jörg},
ee = {https://doi.org/10.1007/978-0-387-73661-7_15},
interhash = {a4de6a942f98129744ed24afaf258776},
intrahash = {0c5e4b7ab093abb043cef0d753475fe3},
isbn = {978-0-387-73660-0},
keywords = {dblp},
pages = {221-244},
publisher = {Springer},
series = {IFIP},
timestamp = {2018-06-27T13:12:42.000+0200},
title = {Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint.},
url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#LarssonE05},
volume = 240,
year = 2005
}