%0 Journal Article %1 KUN96c %A Kunz, R. E. %A Schöll, E. %A Gajewski, H. %A Nürnberg, R. %D 1996 %J Sol.~State El. %K imported %N 8 %P 1155--1164 %T Low-temperature impurity breakdown in semiconductors: an approach towards efficient device simulation %V 39

@article{KUN96c, added-at = {2009-03-03T17:19:04.000+0100}, author = {Kunz, R. E. and Sch{\"o}ll, E. and Gajewski, H. and N{\"u}rnberg, R.}, biburl = {https://www.bibsonomy.org/bibtex/2ac61d2b7097f366a6ec5acc5a159dbb7/bronckobuster}, interhash = {a5661fecd7367850e26e76547765d898}, intrahash = {ac61d2b7097f366a6ec5acc5a159dbb7}, journal = {Sol.~State El.}, keywords = {imported}, nota = {rk:}, number = 8, pages = {1155--1164}, timestamp = {2009-03-03T17:19:26.000+0100}, title = {Low-temperature impurity breakdown in semiconductors: an approach towards efficient device simulation}, volume = 39, year = 1996 }