%0 Conference Paper %1 conf/etfa/KropatschekGAMK22 %A Kropatschek, Sebastian %A Gert, Oskar %A Ayatollahi, Iman %A Meixner, Kristof %A Kiesling, Elmar %A Steigberger, Alexander %A Lüder, Arndt %A Biffl, Stefan %B ETFA %D 2022 %I IEEE %K dblp %P 1-8 %T Designing a Digital Shadow for Efficient, Low-Delay Analysis of Production Quality Risk. %U http://dblp.uni-trier.de/db/conf/etfa/etfa2022.html#KropatschekGAMK22 %@ 978-1-6654-9996-5

@inproceedings{conf/etfa/KropatschekGAMK22, added-at = {2022-11-02T00:00:00.000+0100}, author = {Kropatschek, Sebastian and Gert, Oskar and Ayatollahi, Iman and Meixner, Kristof and Kiesling, Elmar and Steigberger, Alexander and Lüder, Arndt and Biffl, Stefan}, biburl = {https://www.bibsonomy.org/bibtex/2a24e95353a5d7e5eb86d79ba580d0c28/dblp}, booktitle = {ETFA}, crossref = {conf/etfa/2022}, ee = {https://doi.org/10.1109/ETFA52439.2022.9921582}, interhash = {a75579070a6e652dfb383ce5277b787d}, intrahash = {a24e95353a5d7e5eb86d79ba580d0c28}, isbn = {978-1-6654-9996-5}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2024-04-10T00:17:49.000+0200}, title = {Designing a Digital Shadow for Efficient, Low-Delay Analysis of Production Quality Risk.}, url = {http://dblp.uni-trier.de/db/conf/etfa/etfa2022.html#KropatschekGAMK22}, year = 2022 }