%0 Conference Paper %1 conf/icicdt/SuzukiKM13 %A Suzuki, Masamichi %A Kinoshita, Atsuhiro %A Mitani, Yuichiro %B ICICDT %D 2013 %I IEEE %K dblp %P 195-198 %T Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. %U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2013.html#SuzukiKM13 %@ 978-1-4673-4740-2

@inproceedings{conf/icicdt/SuzukiKM13, added-at = {2016-05-19T00:00:00.000+0200}, author = {Suzuki, Masamichi and Kinoshita, Atsuhiro and Mitani, Yuichiro}, biburl = {https://www.bibsonomy.org/bibtex/2b55ab262b03f662952b4165fe16e8e8b/dblp}, booktitle = {ICICDT}, crossref = {conf/icicdt/2013}, ee = {http://dx.doi.org/10.1109/ICICDT.2013.6563335}, interhash = {a79c7d0d6f0cdc43e3c471382b5b1b5e}, intrahash = {b55ab262b03f662952b4165fe16e8e8b}, isbn = {978-1-4673-4740-2}, keywords = {dblp}, pages = {195-198}, publisher = {IEEE}, timestamp = {2016-05-20T11:38:25.000+0200}, title = {Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits.}, url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2013.html#SuzukiKM13}, year = 2013 }