%0 Conference Paper %1 conf/csa2/BaekSLL17 %A Baek, Dusan %A Shin, Jong-Hwan %A Lee, Byungjeong %A Lee, Jung-Won %B CSA/CUTE %D 2017 %E Park, James J. %E Loia, Vincenzo %E Yi, Gangman %E Sung, Yunsick %I Springer %K dblp %P 1192-1198 %T Defect Management Method for Content-based Document Artifact Test in Software R&D Project. %U http://dblp.uni-trier.de/db/conf/csa2/csa2017.html#BaekSLL17 %V 474 %@ 978-981-10-7605-3

@inproceedings{conf/csa2/BaekSLL17, added-at = {2019-08-08T00:00:00.000+0200}, author = {Baek, Dusan and Shin, Jong-Hwan and Lee, Byungjeong and Lee, Jung-Won}, biburl = {https://www.bibsonomy.org/bibtex/22a364775b1ba71f4a59575bd95008cbd/dblp}, booktitle = {CSA/CUTE}, crossref = {conf/csa2/2017}, editor = {Park, James J. and Loia, Vincenzo and Yi, Gangman and Sung, Yunsick}, ee = {https://doi.org/10.1007/978-981-10-7605-3_190}, interhash = {a7e149b0ccb16b0f7f7e17dcfb135ae2}, intrahash = {2a364775b1ba71f4a59575bd95008cbd}, isbn = {978-981-10-7605-3}, keywords = {dblp}, pages = {1192-1198}, publisher = {Springer}, series = {Lecture Notes in Electrical Engineering}, timestamp = {2019-08-09T11:46:30.000+0200}, title = {Defect Management Method for Content-based Document Artifact Test in Software R&D Project.}, url = {http://dblp.uni-trier.de/db/conf/csa2/csa2017.html#BaekSLL17}, volume = 474, year = 2017 }