%0 Conference Paper %1 conf/sigsoft/Ni0Y0L022 %A Ni, Chao %A Wang, Wei %A Yang, Kaiwen %A Xia, Xin %A Liu, Kui %A Lo, David %B ESEC/SIGSOFT FSE %D 2022 %E Roychoudhury, Abhik %E Cadar, Cristian %E Kim, Miryung %I ACM %K dblp %P 672-683 %T The best of both worlds: integrating semantic features with expert features for defect prediction and localization. %U http://dblp.uni-trier.de/db/conf/sigsoft/fse2022.html#Ni0Y0L022 %@ 978-1-4503-9413-0

@inproceedings{conf/sigsoft/Ni0Y0L022, added-at = {2023-06-12T00:00:00.000+0200}, author = {Ni, Chao and Wang, Wei and Yang, Kaiwen and Xia, Xin and Liu, Kui and Lo, David}, biburl = {https://www.bibsonomy.org/bibtex/2b1e260813751927908aed9a54305fd91/dblp}, booktitle = {ESEC/SIGSOFT FSE}, crossref = {conf/sigsoft/2022}, editor = {Roychoudhury, Abhik and Cadar, Cristian and Kim, Miryung}, ee = {https://doi.org/10.1145/3540250.3549165}, interhash = {a7f14e3eb713f3d034557fbd8100a327}, intrahash = {b1e260813751927908aed9a54305fd91}, isbn = {978-1-4503-9413-0}, keywords = {dblp}, pages = {672-683}, publisher = {ACM}, timestamp = {2024-04-09T17:53:12.000+0200}, title = {The best of both worlds: integrating semantic features with expert features for defect prediction and localization.}, url = {http://dblp.uni-trier.de/db/conf/sigsoft/fse2022.html#Ni0Y0L022}, year = 2022 }