%0 Conference Paper %1 conf/siu/Ayav15 %A Ayav, Tolga %B SIU %D 2015 %I IEEE %K dblp %P 128-131 %T Fourier analysis-based automatic test pattern generation for combinational circuits. %U http://dblp.uni-trier.de/db/conf/siu/siu2015.html#Ayav15 %@ 978-1-4673-7386-9

@inproceedings{conf/siu/Ayav15, added-at = {2020-03-27T00:00:00.000+0100}, author = {Ayav, Tolga}, biburl = {https://www.bibsonomy.org/bibtex/2066419de9f2483d986a48295f6ece025/dblp}, booktitle = {SIU}, crossref = {conf/siu/2015}, ee = {https://doi.org/10.1109/SIU.2015.7129939}, interhash = {a967f532fb533c511960ac894a93e113}, intrahash = {066419de9f2483d986a48295f6ece025}, isbn = {978-1-4673-7386-9}, keywords = {dblp}, pages = {128-131}, publisher = {IEEE}, timestamp = {2024-04-10T02:30:01.000+0200}, title = {Fourier analysis-based automatic test pattern generation for combinational circuits.}, url = {http://dblp.uni-trier.de/db/conf/siu/siu2015.html#Ayav15}, year = 2015 }