%0 Conference Paper %1 conf/isqed/HalderC04 %A Halder, Achintya %A Chatterjee, Abhijit %B ISQED %D 2004 %I IEEE Computer Society %K dblp %P 401-406 %T Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2004.html#HalderC04 %@ 0-7695-2093-6

@inproceedings{conf/isqed/HalderC04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Halder, Achintya and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/2507e6dd9f69850cb7c231c980cc48f0b/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283707}, interhash = {ab3c5bf393de28384cd6d0996a22ee36}, intrahash = {507e6dd9f69850cb7c231c980cc48f0b}, isbn = {0-7695-2093-6}, keywords = {dblp}, pages = {401-406}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:10:25.000+0200}, title = {Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2004.html#HalderC04}, year = 2004 }