%0 Conference Paper %1 conf/dsd/UbarKREL07 %A Ubar, Raimund %A Kostin, Sergei %A Raik, Jaan %A Evartson, Teet %A Lensen, Harri %B DSD %D 2007 %I IEEE Computer Society %K dblp %P 604-610 %T Fault Diagnosis in Integrated Circuits with BIST. %U http://dblp.uni-trier.de/db/conf/dsd/dsd2007.html#UbarKREL07 %@ 0-7695-2978-X

@inproceedings{conf/dsd/UbarKREL07, added-at = {2017-05-19T00:00:00.000+0200}, author = {Ubar, Raimund and Kostin, Sergei and Raik, Jaan and Evartson, Teet and Lensen, Harri}, biburl = {https://www.bibsonomy.org/bibtex/2e0a56a895a4aee091c344a8e43469bb9/dblp}, booktitle = {DSD}, crossref = {conf/dsd/2007}, ee = {https://doi.org/10.1109/DSD.2007.4341530}, interhash = {acc1f0614c4de6a6456fb6721f810d26}, intrahash = {e0a56a895a4aee091c344a8e43469bb9}, isbn = {0-7695-2978-X}, keywords = {dblp}, pages = {604-610}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:23:55.000+0200}, title = {Fault Diagnosis in Integrated Circuits with BIST.}, url = {http://dblp.uni-trier.de/db/conf/dsd/dsd2007.html#UbarKREL07}, year = 2007 }