%0 Journal Article %1 journals/et/Sachdev95 %A Sachdev, Manoj %D 1995 %J J. Electron. Test. %K dblp %N 2 %P 191-202 %T Reducing the CMOS RAM test complexity withIDDQ and voltage testing. %U http://dblp.uni-trier.de/db/journals/et/et6.html#Sachdev95 %V 6

@article{journals/et/Sachdev95, added-at = {2020-09-11T00:00:00.000+0200}, author = {Sachdev, Manoj}, biburl = {https://www.bibsonomy.org/bibtex/254a702acf2c30431dd3975e7498cfa99/dblp}, ee = {https://doi.org/10.1007/BF00993086}, interhash = {ad71f7a9685123dd38ac29f39348d3ae}, intrahash = {54a702acf2c30431dd3975e7498cfa99}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {191-202}, timestamp = {2020-09-12T11:41:23.000+0200}, title = {Reducing the CMOS RAM test complexity withIDDQ and voltage testing.}, url = {http://dblp.uni-trier.de/db/journals/et/et6.html#Sachdev95}, volume = 6, year = 1995 }