%0 Journal Article %1 journals/jsjkx/YiWLCL18 %A Yi, Zelong %A Wen, Yumei %A Lin, Yanmin %A Chen, Weiting %A Lv, Guanyu %D 2018 %J 计算机科学 %K dblp %N 2 %P 241-248 %T 多层缺陷关联效应对软件可靠性增长过程的影响 (Impacts of Correlation Effects among Multi-layer Faults on Software Reliability Growth Processes). %U http://dblp.uni-trier.de/db/journals/jsjkx/jsjkx45.html#YiWLCL18 %V 45

@article{journals/jsjkx/YiWLCL18, added-at = {2020-03-12T00:00:00.000+0100}, author = {Yi, Zelong and Wen, Yumei and Lin, Yanmin and Chen, Weiting and Lv, Guanyu}, biburl = {https://www.bibsonomy.org/bibtex/29aa89ab90cd4c26f7cd497a4e63baa1c/dblp}, ee = {http://www.jsjkx.com/EN/10.11896/j.issn.1002-137X.2018.02.042}, interhash = {ade9582b3d7208bfd30bb23136acb811}, intrahash = {9aa89ab90cd4c26f7cd497a4e63baa1c}, journal = {计算机科学}, keywords = {dblp}, number = 2, pages = {241-248}, timestamp = {2020-03-13T12:04:30.000+0100}, title = {多层缺陷关联效应对软件可靠性增长过程的影响 (Impacts of Correlation Effects among Multi-layer Faults on Software Reliability Growth Processes).}, url = {http://dblp.uni-trier.de/db/journals/jsjkx/jsjkx45.html#YiWLCL18}, volume = 45, year = 2018 }