%0 Journal Article %1 journals/dt/SegalJLC01 %A Segal, Julie %A Jee, Alvin %A Lepejian, David Y. %A Chu, Ben %D 2001 %J IEEE Des. Test Comput. %K dblp %N 3 %P 28-39 %T Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. %U http://dblp.uni-trier.de/db/journals/dt/dt18.html#SegalJLC01 %V 18

@article{journals/dt/SegalJLC01, added-at = {2020-05-17T00:00:00.000+0200}, author = {Segal, Julie and Jee, Alvin and Lepejian, David Y. and Chu, Ben}, biburl = {https://www.bibsonomy.org/bibtex/2381f0e592706dfd5c259d21aac0f24c7/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.922801}, interhash = {ae42140b6fe8146f550d9039e2b28b2d}, intrahash = {381f0e592706dfd5c259d21aac0f24c7}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 3, pages = {28-39}, timestamp = {2020-05-19T12:20:46.000+0200}, title = {Using Electrical Bitmap Results from Embedded Memory to Enhance Yield.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt18.html#SegalJLC01}, volume = 18, year = 2001 }