%0 Conference Paper %1 conf/itc/NamCKKMLJKKSKK08 %A Nam, Junghyun %A Chun, Sunghoon %A Koo, Gibum %A Kim, Yanggi %A Moon, Byungsoo %A Lim, Jonghyoung %A Joo, Jaehoon %A Kang, Sangseok %A Kim, Hoonjung %A Shin, Kyeongseon %A Kang, Kisang %A Kang, Sungho %B ITC %D 2008 %E Young, Douglas %E Touba, Nur A. %I IEEE Computer Society %K dblp %P 1-10 %T A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. %U http://dblp.uni-trier.de/db/conf/itc/itc2008.html#NamCKKMLJKKSKK08 %@ 978-1-4244-2403-0

@inproceedings{conf/itc/NamCKKMLJKKSKK08, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nam, Junghyun and Chun, Sunghoon and Koo, Gibum and Kim, Yanggi and Moon, Byungsoo and Lim, Jonghyoung and Joo, Jaehoon and Kang, Sangseok and Kim, Hoonjung and Shin, Kyeongseon and Kang, Kisang and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/2be3bbf71101a97cee34593627cbd55ed/dblp}, booktitle = {ITC}, crossref = {conf/itc/2008}, editor = {Young, Douglas and Touba, Nur A.}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2008.4700632}, interhash = {aee02450f03625711fc86f978e211db2}, intrahash = {be3bbf71101a97cee34593627cbd55ed}, isbn = {978-1-4244-2403-0}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:13.000+0200}, title = {A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2008.html#NamCKKMLJKKSKK08}, year = 2008 }