%0 Conference Paper %1 conf/vts/MittalSP10 %A Mittal, Rajesh %A Sontakke, Adesh %A Parekhji, Rubin A. %B VTS %D 2010 %I IEEE Computer Society %K dblp %P 40 %T Test time reduction using parallel RF test techniques. %U http://dblp.uni-trier.de/db/conf/vts/vts2010.html#MittalSP10 %@ 978-1-4244-6648-1

@inproceedings{conf/vts/MittalSP10, added-at = {2012-02-02T00:00:00.000+0100}, author = {Mittal, Rajesh and Sontakke, Adesh and Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/2c49cfcb8ed32d26dd42f65bf3128060f/dblp}, booktitle = {VTS}, crossref = {conf/vts/2010}, ee = {http://dx.doi.org/10.1109/VTS.2010.5469623}, interhash = {b3d603c84e3823a44ba46a5423e637cf}, intrahash = {c49cfcb8ed32d26dd42f65bf3128060f}, isbn = {978-1-4244-6648-1}, keywords = {dblp}, pages = 40, publisher = {IEEE Computer Society}, timestamp = {2015-06-18T22:53:39.000+0200}, title = {Test time reduction using parallel RF test techniques.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2010.html#MittalSP10}, year = 2010 }