%0 Conference Paper %1 conf/irps/KemmerDBPBKQA20 %A Kemmer, Tobias %A Dammann, Michael %A Baeumler, Martina %A Polyakov, Vladimir %A Brückner, Peter %A Konstanzer, Helmer %A Quay, Rüdiger %A Ambacher, Oliver %B IRPS %D 2020 %I IEEE %K dblp %P 1-6 %T Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#KemmerDBPBKQA20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/KemmerDBPBKQA20, added-at = {2021-10-14T00:00:00.000+0200}, author = {Kemmer, Tobias and Dammann, Michael and Baeumler, Martina and Polyakov, Vladimir and Brückner, Peter and Konstanzer, Helmer and Quay, Rüdiger and Ambacher, Oliver}, biburl = {https://www.bibsonomy.org/bibtex/255e2513e46c766094379f381d8da5de0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128308}, interhash = {b8e8562e515858990dc2a15e2fb4c466}, intrahash = {55e2513e46c766094379f381d8da5de0}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#KemmerDBPBKQA20}, year = 2020 }