%0 Conference Paper %1 conf/date/LinSKRM15 %A Lin, David %A S, Eswaran %A Kumar, Sharad %A Rentschler, Eric %A Mitra, Subhasish %B DATE %D 2015 %E Nebel, Wolfgang %E Atienza, David %I ACM %K dblp %P 1168-1173 %T Quick error detection tests with fast runtimes for effective post-silicon validation and debug. %U http://dblp.uni-trier.de/db/conf/date/date2015.html#LinSKRM15 %@ 978-3-9815370-4-8

@inproceedings{conf/date/LinSKRM15, added-at = {2021-08-09T00:00:00.000+0200}, author = {Lin, David and S, Eswaran and Kumar, Sharad and Rentschler, Eric and Mitra, Subhasish}, biburl = {https://www.bibsonomy.org/bibtex/26c1f07f1bb0987e2fa63d7584ae76090/dblp}, booktitle = {DATE}, crossref = {conf/date/2015}, editor = {Nebel, Wolfgang and Atienza, David}, ee = {https://ieeexplore.ieee.org/document/7092564/}, interhash = {b94775afd8e6dfef4b9f63d0de3899e4}, intrahash = {6c1f07f1bb0987e2fa63d7584ae76090}, isbn = {978-3-9815370-4-8}, keywords = {dblp}, pages = {1168-1173}, publisher = {ACM}, timestamp = {2024-04-10T06:47:29.000+0200}, title = {Quick error detection tests with fast runtimes for effective post-silicon validation and debug.}, url = {http://dblp.uni-trier.de/db/conf/date/date2015.html#LinSKRM15}, year = 2015 }