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%0 Conference Paper
%1 conf/icmc2/BajeelK20
%A Bajeel, P. N.
%A Kumar, Mahesh
%B ICMC
%D 2020
%E Giri, Debasis
%E Buyya, Rajkumar
%E Ponnusamy, S.
%E De, Debashis
%E Adamatzky, Andrew
%E Abawajy, Jemal H.
%I Springer
%K dblp
%P 483-490
%T Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring.
%U http://dblp.uni-trier.de/db/conf/icmc2/icmc2020.html#BajeelK20
%V 1262
%@ 978-981-15-8061-1
@inproceedings{conf/icmc2/BajeelK20,
added-at = {2023-03-17T00:00:00.000+0100},
author = {Bajeel, P. N. and Kumar, Mahesh},
biburl = {https://www.bibsonomy.org/bibtex/2dddc8da78ecd1dfe7c7a526d4074c760/dblp},
booktitle = {ICMC},
crossref = {conf/icmc2/2020},
editor = {Giri, Debasis and Buyya, Rajkumar and Ponnusamy, S. and De, Debashis and Adamatzky, Andrew and Abawajy, Jemal H.},
ee = {https://doi.org/10.1007/978-981-15-8061-1_39},
interhash = {b99144d7a5915d136f89ef15a40d6be0},
intrahash = {dddc8da78ecd1dfe7c7a526d4074c760},
isbn = {978-981-15-8061-1},
keywords = {dblp},
pages = {483-490},
publisher = {Springer},
series = {Advances in Intelligent Systems and Computing},
timestamp = {2024-04-09T18:22:37.000+0200},
title = {Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring.},
url = {http://dblp.uni-trier.de/db/conf/icmc2/icmc2020.html#BajeelK20},
volume = 1262,
year = 2020
}
