%0 Conference Paper %1 conf/rws/KimKLLKKYP13 %A Kim, Joo Hyung %A Kim, Jung Joo %A Lee, Chang-Eun %A Lee, Jong Ho %A Kim, Dong Seok %A Kim, Nam Joo %A Yoo, Kwang Dong %A Park, Heung-Soo %B RWS %D 2013 %I IEEE %K dblp %P 97-99 %T Fluorine improvement of MOSFET interface as revealed by RTS measurements and HRTEM. %U http://dblp.uni-trier.de/db/conf/rws/rws2013.html#KimKLLKKYP13 %@ 978-1-4673-2929-3

@inproceedings{conf/rws/KimKLLKKYP13, added-at = {2017-05-24T00:00:00.000+0200}, author = {Kim, Joo Hyung and Kim, Jung Joo and Lee, Chang-Eun and Lee, Jong Ho and Kim, Dong Seok and Kim, Nam Joo and Yoo, Kwang Dong and Park, Heung-Soo}, biburl = {https://www.bibsonomy.org/bibtex/2d32e452ffb6025e965f39dc16e10a5d3/dblp}, booktitle = {RWS}, crossref = {conf/rws/2013}, ee = {https://doi.org/10.1109/RWS.2013.6486653}, interhash = {ba1f1b668653491e98b5692549657118}, intrahash = {d32e452ffb6025e965f39dc16e10a5d3}, isbn = {978-1-4673-2929-3}, keywords = {dblp}, pages = {97-99}, publisher = {IEEE}, timestamp = {2017-05-25T15:27:29.000+0200}, title = {Fluorine improvement of MOSFET interface as revealed by RTS measurements and HRTEM.}, url = {http://dblp.uni-trier.de/db/conf/rws/rws2013.html#KimKLLKKYP13}, year = 2013 }