%0 Journal Article %1 journals/et/ChepelevPRTZLCK18 %A Chepelev, Vladimir %A Parfenov, Yury %A Radasky, William %A Titov, Boris %A Zdoukhov, Leonid %A Li, Kejie %A Chen, Yuhao %A Kong, Xu %A zhao Xie, Yan %D 2018 %J J. Electron. Test. %K dblp %N 5 %P 547-557 %T Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. %U http://dblp.uni-trier.de/db/journals/et/et34.html#ChepelevPRTZLCK18 %V 34

@article{journals/et/ChepelevPRTZLCK18, added-at = {2020-09-11T00:00:00.000+0200}, author = {Chepelev, Vladimir and Parfenov, Yury and Radasky, William and Titov, Boris and Zdoukhov, Leonid and Li, Kejie and Chen, Yuhao and Kong, Xu and zhao Xie, Yan}, biburl = {https://www.bibsonomy.org/bibtex/200fe6adca37332cf099b75479a6216d7/dblp}, ee = {https://doi.org/10.1007/s10836-018-5749-2}, interhash = {be190627ed778ec0866fc483642c99f6}, intrahash = {00fe6adca37332cf099b75479a6216d7}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {547-557}, timestamp = {2020-09-12T11:40:28.000+0200}, title = {Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP.}, url = {http://dblp.uni-trier.de/db/journals/et/et34.html#ChepelevPRTZLCK18}, volume = 34, year = 2018 }