Inproceedings,
Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays.
G. Shamanna, R. Gaurav, Y. Raghavendra, P. Marfatia, and B. Kshatri.ICICDT, page 1-4. IEEE, (2012)
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- conf/icicdt/ShamannaGRMK12
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- inproceedings
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- ICICDT
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- 2012
- pages
- 1-4
- publisher
- IEEE
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- conf/icicdt/2012
- ee
- http://dx.doi.org/10.1109/ICICDT.2012.6232861
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- 978-1-4673-0146-6
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- http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#ShamannaGRMK12
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%1 conf/icicdt/ShamannaGRMK12
%A Shamanna, Gururaj
%A Gaurav, Raja
%A Raghavendra, Y. K.
%A Marfatia, Percy
%A Kshatri, Bhunesh S.
%B ICICDT
%D 2012
%I IEEE
%K dblp
%P 1-4
%T Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#ShamannaGRMK12
%@ 978-1-4673-0146-6
@inproceedings{conf/icicdt/ShamannaGRMK12,
added-at = {2016-05-27T00:00:00.000+0200},
author = {Shamanna, Gururaj and Gaurav, Raja and Raghavendra, Y. K. and Marfatia, Percy and Kshatri, Bhunesh S.},
biburl = {https://www.bibsonomy.org/bibtex/2b8b08baff15524cfcc376024865fa80f/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2012},
ee = {http://dx.doi.org/10.1109/ICICDT.2012.6232861},
interhash = {be64674ed4c200538f5a4e9195843942},
intrahash = {b8b08baff15524cfcc376024865fa80f},
isbn = {978-1-4673-0146-6},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2016-05-28T12:03:07.000+0200},
title = {Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#ShamannaGRMK12},
year = 2012
}