%0 Journal Article %1 journals/tcad/BlantonDD06 %A Blanton, Ronald D. %A Dwarakanath, Kumar N. %A Desineni, Rao %D 2006 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 2450-2464 %T Defect Modeling Using Fault Tuples. %U http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#BlantonDD06 %V 25

@article{journals/tcad/BlantonDD06, added-at = {2020-09-24T00:00:00.000+0200}, author = {Blanton, Ronald D. and Dwarakanath, Kumar N. and Desineni, Rao}, biburl = {https://www.bibsonomy.org/bibtex/2947b63813a40a654991683cf6812e4b4/dblp}, ee = {https://doi.org/10.1109/TCAD.2006.870836}, interhash = {bf20fd283fae2b7a9764028044616d66}, intrahash = {947b63813a40a654991683cf6812e4b4}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {2450-2464}, timestamp = {2020-09-25T11:50:13.000+0200}, title = {Defect Modeling Using Fault Tuples.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#BlantonDD06}, volume = 25, year = 2006 }