%0 Conference Paper %1 conf/itc/LeeP91 %A Lee, Jaushin %A Patel, Janak H. %B ITC %D 1991 %I IEEE Computer Society %K dblp %P 729-738 %T ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults. %U http://dblp.uni-trier.de/db/conf/itc/itc1991.html#LeeP91 %@ 0-8186-9156-5

@inproceedings{conf/itc/LeeP91, added-at = {2017-05-24T00:00:00.000+0200}, author = {Lee, Jaushin and Patel, Janak H.}, biburl = {https://www.bibsonomy.org/bibtex/22c1e97c7e3f6da65bbf3da8b73c8ca7f/dblp}, booktitle = {ITC}, crossref = {conf/itc/1991}, ee = {https://doi.org/10.1109/TEST.1991.519738}, interhash = {bf4f27ef4a66d3754412aef5ffd539c6}, intrahash = {2c1e97c7e3f6da65bbf3da8b73c8ca7f}, isbn = {0-8186-9156-5}, keywords = {dblp}, pages = {729-738}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:59.000+0100}, title = {ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1991.html#LeeP91}, year = 1991 }