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%0 Conference Paper
%1 conf/itc/LeeP91
%A Lee, Jaushin
%A Patel, Janak H.
%B ITC
%D 1991
%I IEEE Computer Society
%K dblp
%P 729-738
%T ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults.
%U http://dblp.uni-trier.de/db/conf/itc/itc1991.html#LeeP91
%@ 0-8186-9156-5
@inproceedings{conf/itc/LeeP91,
added-at = {2017-05-24T00:00:00.000+0200},
author = {Lee, Jaushin and Patel, Janak H.},
biburl = {https://www.bibsonomy.org/bibtex/22c1e97c7e3f6da65bbf3da8b73c8ca7f/dblp},
booktitle = {ITC},
crossref = {conf/itc/1991},
ee = {https://doi.org/10.1109/TEST.1991.519738},
interhash = {bf4f27ef4a66d3754412aef5ffd539c6},
intrahash = {2c1e97c7e3f6da65bbf3da8b73c8ca7f},
isbn = {0-8186-9156-5},
keywords = {dblp},
pages = {729-738},
publisher = {IEEE Computer Society},
timestamp = {2019-02-14T11:45:59.000+0100},
title = {ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1991.html#LeeP91},
year = 1991
}