%0 Conference Paper %1 conf/kbse/YoonY21 %A Yoon, Juyeon %A Yoo, Shin %B ASE Workshops %D 2021 %I IEEE %K dblp %P 232-238 %T Enhancing Lexical Representation of Test Coverage for Failure Clustering. %U http://dblp.uni-trier.de/db/conf/kbse/ase2021w.html#YoonY21 %@ 978-1-6654-3583-3

@inproceedings{conf/kbse/YoonY21, added-at = {2022-01-31T00:00:00.000+0100}, author = {Yoon, Juyeon and Yoo, Shin}, biburl = {https://www.bibsonomy.org/bibtex/225bb04f46ab6c2b8fc8d2249c836de07/dblp}, booktitle = {ASE Workshops}, crossref = {conf/kbse/2021w}, ee = {https://doi.org/10.1109/ASEW52652.2021.00052}, interhash = {c257859fb631b6a0072fb6258563e4b8}, intrahash = {25bb04f46ab6c2b8fc8d2249c836de07}, isbn = {978-1-6654-3583-3}, keywords = {dblp}, pages = {232-238}, publisher = {IEEE}, timestamp = {2024-04-09T23:51:56.000+0200}, title = {Enhancing Lexical Representation of Test Coverage for Failure Clustering.}, url = {http://dblp.uni-trier.de/db/conf/kbse/ase2021w.html#YoonY21}, year = 2021 }