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%0 Conference Paper
%1 conf/vts/WangMKW95
%A Wang, Li-C.
%A Mercer, M. Ray
%A Kao, Sophia W.
%A Williams, Thomas W.
%B VTS
%D 1995
%I IEEE Computer Society
%K dblp
%P 74-83
%T On the decline of testing efficiency as fault coverage approaches 100%.
%U http://dblp.uni-trier.de/db/conf/vts/vts1995.html#WangMKW95
%@ 0-8186-7000-2
@inproceedings{conf/vts/WangMKW95,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Wang, Li-C. and Mercer, M. Ray and Kao, Sophia W. and Williams, Thomas W.},
biburl = {https://www.bibsonomy.org/bibtex/226847d944517a106a494d032a2df5639/dblp},
booktitle = {VTS},
crossref = {conf/vts/1995},
ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512620},
interhash = {c4bbe21140001b742fb31d0899aa6d30},
intrahash = {26847d944517a106a494d032a2df5639},
isbn = {0-8186-7000-2},
keywords = {dblp},
pages = {74-83},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T07:35:33.000+0200},
title = {On the decline of testing efficiency as fault coverage approaches 100%.},
url = {http://dblp.uni-trier.de/db/conf/vts/vts1995.html#WangMKW95},
year = 1995
}