%0 Conference Paper %1 conf/vts/WangMKW95 %A Wang, Li-C. %A Mercer, M. Ray %A Kao, Sophia W. %A Williams, Thomas W. %B VTS %D 1995 %I IEEE Computer Society %K dblp %P 74-83 %T On the decline of testing efficiency as fault coverage approaches 100%. %U http://dblp.uni-trier.de/db/conf/vts/vts1995.html#WangMKW95 %@ 0-8186-7000-2

@inproceedings{conf/vts/WangMKW95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wang, Li-C. and Mercer, M. Ray and Kao, Sophia W. and Williams, Thomas W.}, biburl = {https://www.bibsonomy.org/bibtex/226847d944517a106a494d032a2df5639/dblp}, booktitle = {VTS}, crossref = {conf/vts/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512620}, interhash = {c4bbe21140001b742fb31d0899aa6d30}, intrahash = {26847d944517a106a494d032a2df5639}, isbn = {0-8186-7000-2}, keywords = {dblp}, pages = {74-83}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:33.000+0200}, title = {On the decline of testing efficiency as fault coverage approaches 100%.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1995.html#WangMKW95}, year = 1995 }