%0 Conference Paper %1 conf/irps/MarcuzziASMGMZM24 %A Marcuzzi, Alberto %A Avramenko, M. %A Santi, Carlo De %A Moens, Peter %A Geenen, F. %A Meneghesso, Gaudenzio %A Zanoni, Enrico %A Meneghini, Matteo %B IRPS %D 2024 %I IEEE %K dblp %P 1-5 %T Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements. %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#MarcuzziASMGMZM24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/MarcuzziASMGMZM24, added-at = {2024-10-06T00:00:00.000+0200}, author = {Marcuzzi, Alberto and Avramenko, M. and Santi, Carlo De and Moens, Peter and Geenen, F. and Meneghesso, Gaudenzio and Zanoni, Enrico and Meneghini, Matteo}, biburl = {https://www.bibsonomy.org/bibtex/29272a0c4214306832275eadd757b758b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529310}, interhash = {c54776c4b8acf11bedef4b6c37ccd742}, intrahash = {9272a0c4214306832275eadd757b758b}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-10-07T09:55:15.000+0200}, title = {Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#MarcuzziASMGMZM24}, year = 2024 }