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%0 Conference Paper
%1 conf/essderc/AmorosoGMAA12
%A Amoroso, Salvatore M.
%A Gerrer, Louis
%A Markov, Stanislav
%A Adamu-Lema, Fikru
%A Asenov, Asen
%B ESSDERC
%D 2012
%I IEEE
%K dblp
%P 109-112
%T Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2012.html#AmorosoGMAA12
%@ 978-1-4673-1707-8
@inproceedings{conf/essderc/AmorosoGMAA12,
added-at = {2017-05-19T00:00:00.000+0200},
author = {Amoroso, Salvatore M. and Gerrer, Louis and Markov, Stanislav and Adamu-Lema, Fikru and Asenov, Asen},
biburl = {https://www.bibsonomy.org/bibtex/2615fc4c80c025861ffeb78fb6964ccd3/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2012},
ee = {https://doi.org/10.1109/ESSDERC.2012.6343345},
interhash = {c64c0040056591c58c812641d9bfe107},
intrahash = {615fc4c80c025861ffeb78fb6964ccd3},
isbn = {978-1-4673-1707-8},
keywords = {dblp},
pages = {109-112},
publisher = {IEEE},
timestamp = {2019-10-17T12:39:51.000+0200},
title = {Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2012.html#AmorosoGMAA12},
year = 2012
}
