%0 Conference Paper %1 conf/isqed/BickfordHGMJK10 %A Bickford, Jeanne %A Habib, Nazmul %A Goss, John %A McMahon, Robert %A Joshi, Rajiv V. %A Kanj, Rouwaida %B ISQED %D 2010 %I IEEE %K dblp %P 315-319 %T Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#BickfordHGMJK10 %@ 978-1-4244-6455-5

@inproceedings{conf/isqed/BickfordHGMJK10, added-at = {2010-04-22T00:00:00.000+0200}, author = {Bickford, Jeanne and Habib, Nazmul and Goss, John and McMahon, Robert and Joshi, Rajiv V. and Kanj, Rouwaida}, biburl = {https://www.bibsonomy.org/bibtex/2216439884967d0221ed2377746489849/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2010}, ee = {http://dx.doi.org/10.1109/ISQED.2010.5450445}, interhash = {c6edc467e802b3c8d058e7166022def6}, intrahash = {216439884967d0221ed2377746489849}, isbn = {978-1-4244-6455-5}, keywords = {dblp}, pages = {315-319}, publisher = {IEEE}, timestamp = {2015-04-28T10:57:02.000+0200}, title = {Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#BickfordHGMJK10}, year = 2010 }