%0 Conference Paper %1 conf/kdd/FountainDS00 %A Fountain, Tony %A Dietterich, Thomas G. %A Sudyka, Bill %B KDD %D 2000 %E Ramakrishnan, Raghu %E Stolfo, Salvatore J. %E Bayardo, Roberto J. %E Parsa, Ismail %I ACM %K dblp %P 18-25 %T Mining IC test data to optimize VLSI testing. %U http://dblp.uni-trier.de/db/conf/kdd/kdd2000.html#FountainDS00 %@ 1-58113-233-6

@inproceedings{conf/kdd/FountainDS00, added-at = {2018-11-06T00:00:00.000+0100}, author = {Fountain, Tony and Dietterich, Thomas G. and Sudyka, Bill}, biburl = {https://www.bibsonomy.org/bibtex/29ac40f566c982a555d0c6b1c5dd4de4a/dblp}, booktitle = {KDD}, crossref = {conf/kdd/2000}, editor = {Ramakrishnan, Raghu and Stolfo, Salvatore J. and Bayardo, Roberto J. and Parsa, Ismail}, ee = {https://doi.org/10.1145/347090.347099}, interhash = {c73ddb72328d22c6eec50e7d3efab4d6}, intrahash = {9ac40f566c982a555d0c6b1c5dd4de4a}, isbn = {1-58113-233-6}, keywords = {dblp}, pages = {18-25}, publisher = {ACM}, timestamp = {2024-05-13T08:04:04.000+0200}, title = {Mining IC test data to optimize VLSI testing.}, url = {http://dblp.uni-trier.de/db/conf/kdd/kdd2000.html#FountainDS00}, year = 2000 }