%0 Conference Paper %1 conf/wacv/KhalajAK92 %A Khalaj, Babak H. %A Aghajan, Hamid K. %A Kailath, Thomas %B WACV %D 1992 %I IEEE %K dblp %P 266-273 %T Automated direct patterned wafer inspection. %U http://dblp.uni-trier.de/db/conf/wacv/wacv1992.html#KhalajAK92 %@ 0-8186-2840-5

@inproceedings{conf/wacv/KhalajAK92, added-at = {2014-02-06T00:00:00.000+0100}, author = {Khalaj, Babak H. and Aghajan, Hamid K. and Kailath, Thomas}, biburl = {https://www.bibsonomy.org/bibtex/2821b145d8c300a00990fdcf98590193d/dblp}, booktitle = {WACV}, crossref = {conf/wacv/1992}, ee = {http://dx.doi.org/10.1109/ACV.1992.240303}, interhash = {c7923246a7844a398df9f7b388b91fac}, intrahash = {821b145d8c300a00990fdcf98590193d}, isbn = {0-8186-2840-5}, keywords = {dblp}, pages = {266-273}, publisher = {IEEE}, timestamp = {2015-06-18T20:09:40.000+0200}, title = {Automated direct patterned wafer inspection.}, url = {http://dblp.uni-trier.de/db/conf/wacv/wacv1992.html#KhalajAK92}, year = 1992 }