%0 Conference Paper %1 conf/ats/InoueFMYO95 %A Inoue, Tomoo %A Fujiwara, Hideo %A Michinishi, Hiroyuki %A Yokohira, Tokumi %A Okamoto, Takuji %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 259-265 %T Universal test complexity of field-programmable gate arrays. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#InoueFMYO95 %@ 0-8186-7129-7

@inproceedings{conf/ats/InoueFMYO95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Inoue, Tomoo and Fujiwara, Hideo and Michinishi, Hiroyuki and Yokohira, Tokumi and Okamoto, Takuji}, biburl = {https://www.bibsonomy.org/bibtex/2e59166bd07cfde7a206295006bd57544/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485345}, interhash = {c8921e2aae04b82f2bbdea6e162cec35}, intrahash = {e59166bd07cfde7a206295006bd57544}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {259-265}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {Universal test complexity of field-programmable gate arrays.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#InoueFMYO95}, year = 1995 }